Use the same term for self-test
This commit is contained in:
10
MFRC522.h
10
MFRC522.h
@@ -83,7 +83,7 @@
|
||||
// Hint: if needed, you can remove unused self-test data to save flash memory
|
||||
//
|
||||
// Version 0.0 (0x90)
|
||||
// Philips Semiconductors; Preliminary Specification Revision 2.0 - 01 August 2005; 16.1 Sefttest
|
||||
// Philips Semiconductors; Preliminary Specification Revision 2.0 - 01 August 2005; 16.1 self-test
|
||||
const byte MFRC522_firmware_referenceV0_0[] PROGMEM = {
|
||||
0x00, 0x87, 0x98, 0x0f, 0x49, 0xFF, 0x07, 0x19,
|
||||
0xBF, 0x22, 0x30, 0x49, 0x59, 0x63, 0xAD, 0xCA,
|
||||
@@ -95,7 +95,7 @@ const byte MFRC522_firmware_referenceV0_0[] PROGMEM = {
|
||||
0x35, 0x96, 0x98, 0x9E, 0x4F, 0x30, 0x32, 0x8D
|
||||
};
|
||||
// Version 1.0 (0x91)
|
||||
// NXP Semiconductors; Rev. 3.8 - 17 September 2014; 16.1.1 Self test
|
||||
// NXP Semiconductors; Rev. 3.8 - 17 September 2014; 16.1.1 self-test
|
||||
const byte MFRC522_firmware_referenceV1_0[] PROGMEM = {
|
||||
0x00, 0xC6, 0x37, 0xD5, 0x32, 0xB7, 0x57, 0x5C,
|
||||
0xC2, 0xD8, 0x7C, 0x4D, 0xD9, 0x70, 0xC7, 0x73,
|
||||
@@ -107,7 +107,7 @@ const byte MFRC522_firmware_referenceV1_0[] PROGMEM = {
|
||||
0xD9, 0x0F, 0xB5, 0x5E, 0x25, 0x1D, 0x29, 0x79
|
||||
};
|
||||
// Version 2.0 (0x92)
|
||||
// NXP Semiconductors; Rev. 3.8 - 17 September 2014; 16.1.1 Self test
|
||||
// NXP Semiconductors; Rev. 3.8 - 17 September 2014; 16.1.1 self-test
|
||||
const byte MFRC522_firmware_referenceV2_0[] PROGMEM = {
|
||||
0x00, 0xEB, 0x66, 0xBA, 0x57, 0xBF, 0x23, 0x95,
|
||||
0xD0, 0xE3, 0x0D, 0x3D, 0x27, 0x89, 0x5C, 0xDE,
|
||||
@@ -197,7 +197,7 @@ public:
|
||||
TestPinEnReg = 0x33 << 1, // enables pin output driver on pins D1 to D7
|
||||
TestPinValueReg = 0x34 << 1, // defines the values for D1 to D7 when it is used as an I/O bus
|
||||
TestBusReg = 0x35 << 1, // shows the status of the internal test bus
|
||||
AutoTestReg = 0x36 << 1, // controls the digital self test
|
||||
AutoTestReg = 0x36 << 1, // controls the digital self-test
|
||||
VersionReg = 0x37 << 1, // shows the software version
|
||||
AnalogTestReg = 0x38 << 1, // controls the pins AUX1 and AUX2
|
||||
TestDAC1Reg = 0x39 << 1, // defines the test value for TestDAC1
|
||||
@@ -214,7 +214,7 @@ public:
|
||||
PCD_Idle = 0x00, // no action, cancels current command execution
|
||||
PCD_Mem = 0x01, // stores 25 bytes into the internal buffer
|
||||
PCD_GenerateRandomID = 0x02, // generates a 10-byte random ID number
|
||||
PCD_CalcCRC = 0x03, // activates the CRC coprocessor or performs a self test
|
||||
PCD_CalcCRC = 0x03, // activates the CRC coprocessor or performs a self-test
|
||||
PCD_Transmit = 0x04, // transmits data from the FIFO buffer
|
||||
PCD_NoCmdChange = 0x07, // no command change, can be used to modify the CommandReg register bits without affecting the command, for example, the PowerDown bit
|
||||
PCD_Receive = 0x08, // activates the receiver circuits
|
||||
|
||||
Reference in New Issue
Block a user